Scanning Electron Microscope

Equipment



Scanning Electron Microscope
  • Charges a fee for use
  • Access by guest researcher allowed
  • Host technician(s) available
  • The SEM model is Zeiss (LEO) 1455VP
  • Computer system: Windows 7
  • SEM Software: SmartSEM version 5.05
  • Accelerating voltage range of 200V to 30 kV.
  • Magnifications up to 60,000x.


  • Detectors:
    • Secondary electron detector
    • Backscattered detector
    • Variable pressure secondary electron detector
    • Image Output: 8-bit TIFF, up to 3072 x 2304 pixels
    • Large chamber capable of accommodating samples up to approximately 15x15x15cm.

Research Facility



Scientific Imaging Suite
Dalhousie University
Halifax
Nova Scotia (NS)

The SIS hosts and provides training and use of state-of-the-art electron microscopes and sample preparation related accessory equipment. The SIS also provides digital imaging, poster printing and photographing services.


Major equipment at the SIS available for use:
  • Transmission electron microscope (FEI Tecnai 12 TEM)
  • Scanning electron microscope (Zeiss 1455VP SEM)
  • Critical point dryer (Leica EM CPD300)
  • Sputter coater (Leica EM ACE200)
  • Ultramicrotome (Leica EM UC6 and ULTRACUT E)
  • High pressure freezing system (Leica EM PACT)
  • Freeze substitution and low temperature embedding system (Leica EM AFS)
  • Large format printer (Canon imagePROGRAF iPF8000S)

Keywords:

TEM, SEM, electron microscope, critical point dryer, sputter coater, printer, ultramicrotome


  • Biological and Life Sciences
  • Biotechnology

Contacts



Ping Li Primary Contact
9024943309
Manager

Date submitted: Fri, Jul 29, 2016 4:30 PM
Date updated: Tue, Aug 2, 2016 9:03 AM

2018-04-09T04:42:07+00:00