Scanning Electron Microscope


Scanning Electron Microscope
  • Charges a fee for use
  • Access by guest researcher allowed
  • Host technician(s) available
  • The SEM model is Zeiss (LEO) 1455VP
  • Computer system: Windows 7
  • SEM Software: SmartSEM version 5.05
  • Accelerating voltage range of 200V to 30 kV.
  • Magnifications up to 60,000x.

  • Detectors:
    • Secondary electron detector
    • Backscattered detector
    • Variable pressure secondary electron detector
    • Image Output: 8-bit TIFF, up to 3072 x 2304 pixels
    • Large chamber capable of accommodating samples up to approximately 15x15x15cm.

Research Facility

Scientific Imaging Suite
Dalhousie University
Nova Scotia (NS)

The SIS hosts and provides training and use of state-of-the-art electron microscopes and sample preparation related accessory equipment. The SIS also provides digital imaging, poster printing and photographing services.

Major equipment at the SIS available for use:
  • Transmission electron microscope (FEI Tecnai 12 TEM)
  • Scanning electron microscope (Zeiss 1455VP SEM)
  • Critical point dryer (Leica EM CPD300)
  • Sputter coater (Leica EM ACE200)
  • Ultramicrotome (Leica EM UC6 and ULTRACUT E)
  • High pressure freezing system (Leica EM PACT)
  • Freeze substitution and low temperature embedding system (Leica EM AFS)
  • Large format printer (Canon imagePROGRAF iPF8000S)


TEM, SEM, electron microscope, critical point dryer, sputter coater, printer, ultramicrotome

  • Biological and Life Sciences
  • Biotechnology

Industry Liaison Officer

Margaret Palmeter


Ping Li Primary Contact

Date submitted: Fri, Jul 29, 2016 4:30 PM
Date updated: Tue, Aug 2, 2016 9:03 AM

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