Secondary Ion Mass Spectrometer

Equipment



Secondary Ion Mass Spectrometer
Cameca
Cameca IMS 4f

Selected routine analysis include:

 

  • Sulfur isotopes of sulfides

  • Lead isotopes of galena

  • Boron isotopes of tourmaline

  • Trace and rare earth elements of a variety of minerals

 

Research Facility



Secondary Ion Mass Spectrometry
Memorial University
St. John's
Newfoundland and Labrador (NL)

 

SIMS is capable of both isotopic ratios and sub-ppm elemental determinations with extremely high spatial resolution in geological samples. SIMS thus permits spot analysis at lateral resolutions of 15 μm or better, enabling determinations in very small volumes – for example, individual melt inclusions, fine-grained minerals, or fine growth zones within minerals or texturally complex samples.

 

Selected routine analysis include:

 

  • Sulfur isotopes of sulfides

  • Lead isotopes of galena

  • Boron isotopes of tourmaline

  • Trace and rare earth elements of a variety of minerals

 

 

 

 

 

 

  • Biological and Life Sciences
  • Environmental and Earth Sciences
  • Marine/Ocean Sciences
  • Mining, Minerals and Metals

Contacts



Glenn Piercey Primary Contact
7098642714 Ext: 2714
Lab Coordinator

Date submitted: Fri, Sep 28, 2018 10:13 AM
Date updated: Wed, Oct 3, 2018 7:13 PM

2018-10-03T19:13:57+00:00