Scanning Electron Microscope

Equipment



Scanning Electron Microscope
JEOL, Japan
JSM-5900LV

Microscopy and microanalysis.

Low/high vacuum imaging.

In addition, this SEM is equipped with:

  • Backscattered electron detector;
  • CL detector and imaging system;
  • EDS X-ray detector and imaging/analyzing system.
2000

Research Facility



Acadia Centre for Microstructural Analysis (ACMA)
Acadia University
Wolfville
Nova Scotia (NS)

Microscopy and microanalysis

  • Astronomy and Physics
  • Biological and Life Sciences
  • Biomedical
  • Biotechnology
  • Chemistry and Biochemistry
  • Engineering - Agricultural, Forest, Environmental, Mining, Mineral
  • Engineering - Chemical, Nuclear, Other
  • Engineering - Civil, Structural
  • Engineering - Industrial, Mechanical, Electrical
  • Environmental and Earth Sciences
  • Geomatics and Geodesy
  • Medical Sciences
  • Biomedical
  • Biotechnology
  • Agriculture, Animal Science and Food
  • Chemical Industries
  • Life Sciences, Pharmaceuticals and Medical Equipment
  • Mining, Minerals and Metals

Contacts



Haixin Xu Primary Contact
9025851600
Assistant Director
Craig Bennett
9025851150
Director

Date submitted: Mon, Dec 12, 2016 12:28 PM
Date updated: Mon, Dec 12, 2016 12:44 PM

2018-04-09T04:12:03+00:00