SEM is a powerful, non-destructive tool (microscope) used for obtaining high quality images of small volumes of solid materials by scanning the surface of a sample with a focused beam of electrons. These electrons interact with the sample, producing various signals (secondary electron (SE), backscattered electron BSE) and cathodoluminescence (CL)) that provide information about the sample’s topography and composition.
Since its installation ca. 3 years ago, the JEOL JSM-7100F SEM has been routinely used to obtain SE, BSE and CL images as well as elemental analyses and maps on a wide variety of samples and covering a range of operating conditions (kV, nA, magnification, etc.).
Users of the facility include commercial clients, faculty researchers, graduate students, undergraduate Honors students, undergraduate students for class projects and visiting researchers from other universities. Academic research in environmental science, geology, chemistry, biochemistry, physics, engineering and materials characterization has been undertaken in this lab.
Our JEOL JSM-7100F SEM is equipped with a Field Emission source, JEOL SE and BSE detectors, a Deben CL detector and a Thermo Energy Dispersive Spectrometer.
Along with a Rigaku powder X-ray diffractometer (PXRD), this laboratory features a pair of new, state-of-the-art analytical instruments from JEOL: an electron probe microanalyzer (EPMA) and a scanning electron microscope (SEM).
- Astronomy and Physics
- Biological and Life Sciences
- Chemistry and Biochemistry
- Engineering - Agricultural, Forest, Environmental, Mining, Mineral
- Engineering - Civil, Structural
- Engineering - Industrial, Mechanical, Electrical
- Environmental and Earth Sciences
- Marine/Ocean Sciences
- Chemical Industries
- Clean Technology
- Energy (Renewable and Fossil)
- Mining, Minerals and Metals
- Ocean Industries
Date submitted: Wed, Mar 8, 2017 9:03 PM
Date updated: Wed, Mar 8, 2017 9:04 PM