EPMA is a powerful, non-destructive analytical technique used for the qualitative and quantitative determination of the surface chemical composition of small volumes of solid materials. Elements from B to U (and above) can routinely be analyzed using EPMA, with a detection limit of a few hundred ppm. While nearly any solid material can be measured, EPMA requires samples to be polished flat as standard-size rectangular sections or in 1-inch round disks.
Our JEOL JXA-8230 EPMA is equipped with an interchangeable tungsten or LaB6 source, 5 wavelength dispersive spectrometers, a Thermo energy dispersive spectrometer and an xCLent IV cathodoluminescence spectrometer.
Along with a Rigaku powder X-ray diffractometer (PXRD), this laboratory features a pair of new, state-of-the-art analytical instruments from JEOL: an electron probe microanalyzer (EPMA) and a scanning electron microscope (SEM).
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Industry Liaison Officer
Date submitted: Wed, Mar 8, 2017 9:03 PM
Date updated: Wed, Mar 8, 2017 9:04 PM