XPS is used in the surface analysis of materials. It measures the electronic states in a solid by irradiating a specimen with monochromatic x-ray radiation and analyzing the emitted photoelectrons. The information XPS provides about surface layers or thin film structures is of value in many industrial applications. Additional Information

The Facilities for Materials Characterization (FMC) are a diverse set of materials characterization equipment operated by the Clean Technologies Research Institute at Dalhousie University. The FMC equipment can be used on a fee-for-service basis by researchers from academic, industry and government laboratories.

Keywords:

IRM, SEM, PPMS, FIB, FT Raman, XPS, DSC, Hot Press, Grindosonic, mictoscope, materials, institute

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