SEM-MLA-EBSD Laboratory – Micro Analysis Facility (MaF) CREAIT Network

Research Facility

SEM-MLA-EBSD Laboratory - Micro Analysis Facility (MaF) CREAIT Network
Memorial University
St. John's
Newfoundland and Labrador (NL)

The SEMs here within Memorial University's Bruneau Centre include a FEI Quanta 400 for serving general applications in mineralogy, biology, engineering, archaeology, physics and chemistry, and a FEI MLA 650F for serving applications that demand higher resolution. Both SEMs are also capable of environmental SEM (ESEM), which refers to these SEMs' capability for working at variable pressures or near atmospheric pressures instead of limited to high vacuum. ESEM also allows for almost any specimen to be examined, including wet and non-conducting specimens.

For accommodating the variety of information available from electron interaction, our SEMs are also equipped with high throughput energy dispersive x-ray (EDX) analytical systems from Bruker, an electron backscatter diffraction (EBSD) system from HKL, and cathode-luminescence (CL). Both SEMs are also capable of x-ray aided image analysis, i.e., Mineral Liberation Analysis® or MLA®. The MLA software automates image acquisition, stage movement and x-ray acquisition for spatially quantifying mineral abundances and associations of areas as large as a typical thin section of rock.

  • Astronomy and Physics
  • Biological and Life Sciences
  • Chemistry and Biochemistry
  • Engineering - Agricultural, Forest, Environmental, Mining, Mineral
  • Engineering - Civil, Structural
  • Engineering - Industrial, Mechanical, Electrical
  • Environmental and Earth Sciences
  • Marine/Ocean Sciences
  • Chemical Industries
  • Clean Technology
  • Energy (Renewable and Fossil)
  • Mining, Minerals and Metals
  • Ocean Industries

Research Facility

Dylan Goudie
Research Laboratory Coordinator
David Grant
Research Laboratory Coordinator

Brent Myron
Manager of Operations - CREAIT Network

Industry Liaison Officer

Matt Grimes
Technology Commercialization Officer

Equipment 2 piece(s)

Scanning Electron Microscope (SEM) -MLA 650FEG
FEI Company

Versatile multidisciplinary instrument available to internal and external users. High resolution imaging on a variety of sample types, Mineralogical mapping (MLA), quantitative compositional analysis (EDX), Electron backscatter diffraction analysis (EBSD). 

  • Field emission gun (FEG) electron source for high stability, high resolution imaging. Intrinsic SEM imaging resolution ~3.0nm. 
  • Two Bruker XFlash SDD X-ray detectors for EDX analysis. Enery resolution <133 eV.
  • FEI MLA software package for automated mineralogical analysis.
  • ESEM capabilities for imaging wet samples.
  • Oxford EBSD system with Nordlys II camera.

Scanning Electron Microscope (SEM) Quanta 400 MLA
FEI Company
Quanta 400 MLA

General low resolution imaging and EDX applications for internal and external users. Mineralogical mapping (MLA), Cathodoluminescence (CL)

  • Tungsten Filament electron source
  • Bruker XFlash EDX detector
  • MLA software package for automated mineralogical analysis
  • Gatan Cathodoluminescence detector
  • ESEM capabilities for imagine wet samples

Date submitted: Tue, Sep 25, 2018 12:37 PM
Date updated: Wed, Sep 26, 2018 8:44 PM

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