Microscopy and Microanalysis Facility

Research Facility



Microscopy and Microanalysis Facility
University of New Brunswick, Fredericton
Fredericton
New Brunswick (NB)

The Microscopy and Microanalysis Facility (MMF) provides electron and light microscopy services to educational and research institutions, government and industry.  A wide variety of instrumentation and sample preparation equipment is available on a fee for service basis.

  • Biological and Life Sciences
  • Chemistry and Biochemistry
  • Engineering - Agricultural, Forest, Environmental, Mining, Mineral
  • Engineering - Chemical, Nuclear, Other
  • Engineering - Civil, Structural
  • Engineering - Industrial, Mechanical, Electrical
  • Environmental and Earth Sciences
  • Marine/Ocean Sciences
  • Aerospace and Satellites
  • Agriculture, Animal Science and Food
  • Chemical Industries
  • Construction (including Building, Civil Engineering, Specialty Trades)
  • Energy (Renewable and Fossil)
  • Fisheries and Aquaculture
  • Forestry and Forest-Based Industries
  • Life Sciences, Pharmaceuticals and Medical Equipment
  • Manufacturing and Processing
  • Mining, Minerals and Metals
  • Ocean Industries

Contacts



Douglas Hall
dhall@unb.ca
5064473239
Director

Equipment



Scanning Electron Microscope (SEM)
JEOL
JSM-6400

The SEM provides detailed surface information for a wide variety of solid materials.  Elemental composition can be obtained with the accompanying Energy-Dispersive X-ray analysis system (EDS).  Colour cathodoluminescence imaging is also available.


Electron Microprobe (EPMA)
JEOL
JXA-733

The Electron Microprobe is a tool for the non-destructive compositional analysis of small volumes of solid material.  Equipped with several Wavelength-Dispersive x-ray spectrometers (WDS), the microprobe is capable of significantly enhanced spectral resolution and minimum detection limits compared to Energy Dispersive analysis.  Compositional mapping is also available.


(Scanning) Transmission Electron Microscope
JEOL
2011

The Scanning Transmission Electron Microscope (STEM)  enables the examination of the internal structure of thin samples, including crystal structure and crystallography. Phase identification and elemental composition can be determined with the accompanying Energy-Dispersive x-ray microanalysis (EDS) system.

Date submitted: Tue, Feb 21, 2017 4:09 PM
Date updated: Tue, Feb 21, 2017 4:09 PM

2018-04-09T04:37:10+00:00