Along with a Rigaku powder X-ray diffractometer (PXRD), this laboratory features a pair of new, state-of-the-art analytical instruments from JEOL: an electron probe microanalyzer (EPMA) and a scanning electron microscope (SEM).
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SEM is a powerful, non-destructive tool (microscope) used for obtaining high quality images of small volumes of solid materials by scanning the surface of a sample with a focused beam of electrons. These electrons interact with the sample, producing various signals (secondary electron (SE), backscattered electron BSE) and cathodoluminescence (CL)) that provide information about the sample’s topography and composition.
Since its installation ca. 3 years ago, the JEOL JSM-7100F SEM has been routinely used to obtain SE, BSE and CL images as well as elemental analyses and maps on a wide variety of samples and covering a range of operating conditions (kV, nA, magnification, etc.).
Users of the facility include commercial clients, faculty researchers, graduate students, undergraduate Honors students, undergraduate students for class projects and visiting researchers from other universities. Academic research in environmental science, geology, chemistry, biochemistry, physics, engineering and materials characterization has been undertaken in this lab.
Our JEOL JSM-7100F SEM is equipped with a Field Emission source, JEOL SE and BSE detectors, a Deben CL detector and a Thermo Energy Dispersive Spectrometer.
EPMA is a powerful, non-destructive analytical technique used for the qualitative and quantitative determination of the surface chemical composition of small volumes of solid materials. Elements from B to U (and above) can routinely be analyzed using EPMA, with a detection limit of a few hundred ppm. While nearly any solid material can be measured, EPMA requires samples to be polished flat as standard-size rectangular sections or in 1-inch round disks.
Our JEOL JXA-8230 EPMA is equipped with an interchangeable tungsten or LaB6 source, 5 wavelength dispersive spectrometers, a Thermo energy dispersive spectrometer and an xCLent IV cathodoluminescence spectrometer.
Powder and thin film XRD is a powerful, non-destructive analytical technique used for phase identification, quantitative analysis and the determination of crystal structures. XRD is used extensively in material characterization and in quality control for a wide range of materials including metals, minerals, polymers and thin film coatings. The XRD facility has both focusing and parallel beam geometries and a high temperature stage that allows measurements up to 1500°C.
Since its installation 7 years ago, the PXRD has been routinely used to collect and analyze data obtained for various minerals, clay minerals, waste deposits, electrochemically deposited catalysts and thin films. Users of the facility include commercial clients, faculty researchers, graduate students, undergraduate Honors students, undergraduate students for class projects and visiting researchers from other universities. Academic research in environmental science, geology, chemistry, biochemistry, physics, engineering and materials characterization has been undertaken in this lab. Instrument performance is monitored by scanning an in-house quartz standard or a Rigaku Si standard for peak position and relative peak intensity.
Our Rigaku Ultima-IV XRD is equipped with a Cu source, removable monochromator, scintillation detector, standard stage, Auto-Sample Changer (10) stage and high temperature stage. Users also have access to MDI JADE 2010 software, ICSD and ICDD databases while in the facility.
Date submitted: Wed, Mar 8, 2017 9:03 PM
Date updated: Wed, Mar 8, 2017 9:04 PM